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Improved weight assignment for logic switching activity during at-speed test pattern generation.

Authors :
Wu, M.-F.
Pan, H.-C.
Wang, T.-H.
Huang, J.-L.
Tsai, Kun-Han
Cheng, Wu-Tung
Source :
Proceedings of the 2010 Asia & South Pacific Design Automation Conference; 1/18/2010, p493-498, 6p
Publication Year :
2010

Details

Language :
English
ISBNs :
9781605588377
Database :
Complementary Index
Journal :
Proceedings of the 2010 Asia & South Pacific Design Automation Conference
Publication Type :
Conference
Accession number :
83864776