A DFM Methodology to Evaluate the Impact of Lithography Conditions on the Speed of Critical Paths in a VLSI Circuit.

Details

Language :

English

ISBNs :

9780769525235

Database :

Complementary Index

Journal :

7th International Symposium on Quality Electronic Design (ISQED'06)

Publication Type :

Conference

Accession number :

84113148

Full Text :

https://doi.org/10.1109/ISQED.2006.9