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Thin-film encapsulation of inverted indium-tin-oxide-free polymer solar cells by atomic layer deposition with improvement on stability and efficiency.

Authors :
Li, Kan
Fan, Huanhuan
Huang, Chaofan
Hong, Xia
Fang, Xu
Li, Haifeng
Liu, Xu
Li, Chengshuai
Huang, Zhuoyin
Zhen, Hongyu
Source :
Applied Physics Letters; 12/3/2012, Vol. 101 Issue 23, p233902, 4p, 1 Color Photograph, 1 Chart, 3 Graphs
Publication Year :
2012

Abstract

Atomic layer deposition (ALD) technology is employed to encapsulate inverted indium-tin-oxide-free polymer solar cells (IFSCs) with a structure of Al/TiOx/P3HT:PC61BM/PEDOT:PSS. The encapsulation layer, Al2O3, is deposited by ALD on the light incident surface. The thickness of the Al2O3 layer can thus be optimized through optical simulation to minimize light loss of IFSCs. Based on optical calculation, we encapsulated the device (85 nm thick active layer) with a 30 nm thick Al2O3 layer. The resulting ALD encapsulated IFSCs show much better device performance and higher stability than the glass-encapsulated ones. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
101
Issue :
23
Database :
Complementary Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
84122279
Full Text :
https://doi.org/10.1063/1.4769355