Characterization of heteroepitaxial multiferroic interface BiFeO3/SrTiO3/Si by Cs-corrected STEM.

Authors :: Cantu Valle, J.
Ponce, A.
Jose-Yacaman, M.
Droopad, R.
Contreras-Guerrero, R.
Source :: Microscopy & Microanalysis; Jul2012 Supplement, Vol. 18 Issue S2, p1448-1449, 2p
Publication Year :: 2012
Abstract: Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012. [ABSTRACT FROM PUBLISHER]

Subjects :: ABSTRACTS
SCANNING transmission electron microscopy
MOLECULAR beam epitaxy

Full Text Access

Tools