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Characterization of heteroepitaxial multiferroic interface BiFeO3/SrTiO3/Si by Cs-corrected STEM.
- Source :
- Microscopy & Microanalysis; Jul2012 Supplement, Vol. 18 Issue S2, p1448-1449, 2p
- Publication Year :
- 2012
-
Abstract
- Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012. [ABSTRACT FROM PUBLISHER]
- Subjects :
- ABSTRACTS
SCANNING transmission electron microscopy
MOLECULAR beam epitaxy
Subjects
Details
- Language :
- English
- ISSN :
- 14319276
- Volume :
- 18
- Issue :
- S2
- Database :
- Complementary Index
- Journal :
- Microscopy & Microanalysis
- Publication Type :
- Academic Journal
- Accession number :
- 84133801
- Full Text :
- https://doi.org/10.1017/S1431927612009099