Dependence of charge accumulation on sample thickness in Nano-SiO2 doped IDPE.

MLA

Lv, Zepeng, et al. “Dependence of Charge Accumulation on Sample Thickness in Nano-SiO2 Doped IDPE.” IEEE Transactions on Dielectrics & Electrical Insulation, vol. 20, no. 1, Jan. 2013, pp. 337–45. EBSCOhost, https://doi.org/10.1109/TDEI.2013.6451375.

APA

Lv, Z., Wang, X., Wu, K., Chen, X., Cheng, Y., & Dissado, L. (2013). Dependence of charge accumulation on sample thickness in Nano-SiO2 doped IDPE. IEEE Transactions on Dielectrics & Electrical Insulation, 20(1), 337–345. https://doi.org/10.1109/TDEI.2013.6451375

Chicago

Lv, Zepeng, Xia Wang, Kai Wu, Xi Chen, Yonghong Cheng, and L. Dissado. 2013. “Dependence of Charge Accumulation on Sample Thickness in Nano-SiO2 Doped IDPE.” IEEE Transactions on Dielectrics & Electrical Insulation 20 (1): 337–45. doi:10.1109/TDEI.2013.6451375.