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Effects of negative direct voltage pre-stressing on the breakdown of conductor–rod gaps under positive impulse voltages.

Authors :
Allen, N.L.
Gourgoulis, D.E.
Mikropoulos, P.N.
Stassinopoulos, C.A.
Yakinthos, C.G.
Source :
IEE Proceedings -- Science, Measurement & Technology; May1998, Vol. 145 Issue 3, p105-109, 5p
Publication Year :
1998

Details

Language :
English
ISSN :
13502344
Volume :
145
Issue :
3
Database :
Complementary Index
Journal :
IEE Proceedings -- Science, Measurement & Technology
Publication Type :
Academic Journal
Accession number :
86312507
Full Text :
https://doi.org/10.1049/ip-smt:19981964