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Effects of the channel profile on correlation measurements.

Authors :
Osnaghi, S.
Source :
Electronics Letters (Institution of Engineering & Technology); 03/22/1968, Vol. 4 Issue 6, p111-113, 3p
Publication Year :
1968

Details

Language :
English
ISSN :
00135194
Volume :
4
Issue :
6
Database :
Complementary Index
Journal :
Electronics Letters (Institution of Engineering & Technology)
Publication Type :
Academic Journal
Accession number :
86326648
Full Text :
https://doi.org/10.1049/el:19680088