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Graphene interconnect lifetime under high current stress.
- Source :
- 2012 Symposium on VLSI Technology (VLSIT); 1/ 1/2012, p121-122, 2p
- Publication Year :
- 2012
-
Abstract
- Lifetime of multi-layer graphene interconnects under constant current stress is studied for the first time. Under a stress current density of 20MA/cm2 at 250°C exposed to air, Mean-Time-To-Fail (MTTF) of uncapped CVD graphene wire is about 6 hours. It is shown that lifetime is mainly limited by defect formation due to graphene oxidation. [ABSTRACT FROM PUBLISHER]
Details
- Language :
- English
- ISBNs :
- 9781467308465
- Database :
- Complementary Index
- Journal :
- 2012 Symposium on VLSI Technology (VLSIT)
- Publication Type :
- Conference
- Accession number :
- 86594999
- Full Text :
- https://doi.org/10.1109/VLSIT.2012.6242491