A flexible simulation model for system level ESD stresses with application to ESD design and troubleshooting.

A new simulation model, emphasizing integrated circuit testing applications, is proposed for contract discharge from an ESD gun, such as those used for IEC 61000-4-2 and ISO 10605 system-level ESD qualification. Waveforms from simulation are compared with the IEC-61000-4-2 waveform specification and reference waveform. An example application of the model is also presented. [ABSTRACT FROM PUBLISHER]