Back to Search
Start Over
A TEM Study of the Structure of Polycrystalline Si Films on (111) Si Substrates Grown by Low Pressure Chemical Vapor Deposition.
- Source :
- MRS Online Proceedings Library; 01/07/1988, Vol. 106, pN.PAG-1, 1p
- Publication Year :
- 1988
Details
- Language :
- English
- ISSN :
- 19464274
- Volume :
- 106
- Database :
- Complementary Index
- Journal :
- MRS Online Proceedings Library
- Publication Type :
- Conference
- Accession number :
- 86836056
- Full Text :
- https://doi.org/10.1557/PROC-106-15