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Technology scaling and soft error reliability.
- Source :
- 2012 IEEE International Reliability Physics Symposium (IRPS); 1/ 1/2012, p3-3C.1.7, 0p
- Publication Year :
- 2012
-
Abstract
- This paper discusses several attributes of integrated circuit scaling in relation to radiation soft error failure modes and vulnerability. [ABSTRACT FROM PUBLISHER]
Details
- Language :
- English
- ISBNs :
- 9781457716782
- Database :
- Complementary Index
- Journal :
- 2012 IEEE International Reliability Physics Symposium (IRPS)
- Publication Type :
- Conference
- Accession number :
- 87044741
- Full Text :
- https://doi.org/10.1109/IRPS.2012.6241810