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Technology scaling and soft error reliability.

Authors :
Massengill, Lloyd W.
Bhuva, Bharat L.
Holman, W. Timothy
Alles, Michael L.
Loveless, T. Daniel
Source :
2012 IEEE International Reliability Physics Symposium (IRPS); 1/ 1/2012, p3-3C.1.7, 0p
Publication Year :
2012

Abstract

This paper discusses several attributes of integrated circuit scaling in relation to radiation soft error failure modes and vulnerability. [ABSTRACT FROM PUBLISHER]

Details

Language :
English
ISBNs :
9781457716782
Database :
Complementary Index
Journal :
2012 IEEE International Reliability Physics Symposium (IRPS)
Publication Type :
Conference
Accession number :
87044741
Full Text :
https://doi.org/10.1109/IRPS.2012.6241810