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Electron doping limit in Al-doped ZnO by donor-acceptor interactions.

Authors :
Noh, Ji-Young
Kim, Hanchul
Kim, Yong-Sung
Park, C. H.
Source :
Journal of Applied Physics; Apr2013, Vol. 113 Issue 15, p153703, 5p, 1 Diagram, 5 Graphs
Publication Year :
2013

Abstract

We investigate the maximum available free electron carrier density in Al-doped n-type ZnO, based on density-functional theory calculations. The Coulomb interactions between the Al dopants and the Zn-vacancy native acceptors are found to limit the carrier density. In typical growth conditions, the n-type doping limit is found to be in the range of 1019 ∼ 1021 cm-3. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
113
Issue :
15
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
87071598
Full Text :
https://doi.org/10.1063/1.4801533