Stability and robustness analysis of d/dt-closed-loop IGBT gate drive.

MLA

Lobsiger, Yanick, and Johann W. Kolar. “Stability and Robustness Analysis of d/Dt-Closed-Loop IGBT Gate Drive.” 2013 Twenty-Eighth Annual IEEE Applied Power Electronics Conference & Exposition (APEC), Jan. 2013, pp. 2682–89. EBSCOhost, https://doi.org/10.1109/APEC.2013.6520675.

APA

Lobsiger, Y., & Kolar, J. W. (2013). Stability and robustness analysis of d/dt-closed-loop IGBT gate drive. 2013 Twenty-Eighth Annual IEEE Applied Power Electronics Conference & Exposition (APEC), 2682–2689. https://doi.org/10.1109/APEC.2013.6520675

Chicago

Lobsiger, Yanick, and Johann W. Kolar. 2013. “Stability and Robustness Analysis of d/Dt-Closed-Loop IGBT Gate Drive.” 2013 Twenty-Eighth Annual IEEE Applied Power Electronics Conference & Exposition (APEC), January, 2682–89. doi:10.1109/APEC.2013.6520675.