Back to Search Start Over

Resistance instabilities in a filament-based resistive memory.

Authors :
Chen, Frederick T.
Lee, Heng-Yuan
Chen, Yu-Sheng
Rahaman, Shakh Ziaur
Tsai, Chen-Han
Tsai, Kan-Hsueh
Wu, Tai-Yuan
Chen, Wei-Su
Gu, Pei-Yi
Lin, Yu-De
Sheu, Shyh-Shyuan
Tsai, Ming-Jinn
Lee, Li-Heng
Ku, Tzu-Kun
Chen, Pang-Shiu
Source :
2013 IEEE International Reliability Physics Symposium (IRPS); 2013, p5E.1-5E.1-5E.1.7, 0p
Publication Year :
2013

Details

Language :
English
ISBNs :
9781479901128
Database :
Complementary Index
Journal :
2013 IEEE International Reliability Physics Symposium (IRPS)
Publication Type :
Conference
Accession number :
89798613
Full Text :
https://doi.org/10.1109/IRPS.2013.6532040
Full Text Access
View/download PDF

Tools

Authors Abstract Subjects Details