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Estimates of peak areas and relative atomic amounts from wide-scan XPS spectra.
- Source :
- Surface & Interface Analysis: SIA; 1992, Vol. 18 Issue 1, p47-51, 5p
- Publication Year :
- 1992
Details
- Language :
- English
- ISSN :
- 01422421
- Volume :
- 18
- Issue :
- 1
- Database :
- Complementary Index
- Journal :
- Surface & Interface Analysis: SIA
- Publication Type :
- Academic Journal
- Accession number :
- 90816187
- Full Text :
- https://doi.org/10.1002/sia.740180108