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XPS analysis of lithium intercalation in thin films of molybdenum oxysulphides.
- Source :
- Surface & Interface Analysis: SIA; 1994, Vol. 22 Issue 1-12, p206-210, 5p
- Publication Year :
- 1994
Details
- Language :
- English
- ISSN :
- 01422421
- Volume :
- 22
- Issue :
- 1-12
- Database :
- Complementary Index
- Journal :
- Surface & Interface Analysis: SIA
- Publication Type :
- Academic Journal
- Accession number :
- 90816766
- Full Text :
- https://doi.org/10.1002/sia.740220146