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XPS analysis of lithium intercalation in thin films of molybdenum oxysulphides.

Authors :
Benoist, L.
Gonbeau, D.
Pfister-Guillouzo, G.
Schmidt, E.
Meunier, G.
Levasseur, A.
Source :
Surface & Interface Analysis: SIA; 1994, Vol. 22 Issue 1-12, p206-210, 5p
Publication Year :
1994

Details

Language :
English
ISSN :
01422421
Volume :
22
Issue :
1-12
Database :
Complementary Index
Journal :
Surface & Interface Analysis: SIA
Publication Type :
Academic Journal
Accession number :
90816766
Full Text :
https://doi.org/10.1002/sia.740220146