Back to Search
Start Over
AFM Imaging?Reliable or Not?: Validation and Verification of Images in Atomic Force Microscopy.
- Source :
- IEEE Control Systems; Dec2013, Vol. 33 Issue 6, p106-118, 13p
- Publication Year :
- 2013
-
Abstract
- Atomic force microscopy (AFM) was invented in 1986 [1]. By using a compliant flexure probe, such as a microcantilever beam with a sharp tip at one end, the interaction forces between atoms on the probe-tip and atoms on the material surface can be measured (see Figure 1). Since its invention, the simple strategy of using a beam with a sharp tip is now being employed to measure many diverse properties of matter at the nanometer scale including electrical, magnetic, chemical, and mechanical properties [2]. Many different operational modes have evolved that have demonstrated the versatility of the basic underlying principle [3]. AFM has led to many seminal insights in science such as obtained in the recent imaging of pentacene molecules with subatomic resolution [4]. [ABSTRACT FROM PUBLISHER]
Details
- Language :
- English
- ISSN :
- 1066033X
- Volume :
- 33
- Issue :
- 6
- Database :
- Complementary Index
- Journal :
- IEEE Control Systems
- Publication Type :
- Periodical
- Accession number :
- 92003747
- Full Text :
- https://doi.org/10.1109/MCS.2013.2279475