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A full three-dimensional simulation on alpha-particle induced DRAM soft-errors.
- Source :
- 1985 International Electron Devices Meeting; 1985, p496-499, 4p
- Publication Year :
- 1985
Details
- Language :
- English
- Database :
- Complementary Index
- Journal :
- 1985 International Electron Devices Meeting
- Publication Type :
- Conference
- Accession number :
- 92054431
- Full Text :
- https://doi.org/10.1109/IEDM.1985.191012