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A full three-dimensional simulation on alpha-particle induced DRAM soft-errors.

Authors :
Masuda, H.
Toyabe, T.
Shukuri, H.
Ohshima, K.
Itoh, K.
Source :
1985 International Electron Devices Meeting; 1985, p496-499, 4p
Publication Year :
1985

Details

Language :
English
Database :
Complementary Index
Journal :
1985 International Electron Devices Meeting
Publication Type :
Conference
Accession number :
92054431
Full Text :
https://doi.org/10.1109/IEDM.1985.191012