Dynamic redundancy identification in automatic test generation.

Authors :: Abramovici, M.
Miller, D.T.
Roy, R.K.
Source :: 1989 IEEE International Conference on Computer-Aided Design Digest of Technical Papers; 1989, p466-469, 4p
Publication Year :: 1989

Language :: English
ISBNs :: 9780818619861
Database :: Complementary Index
Journal :: 1989 IEEE International Conference on Computer-Aided Design Digest of Technical Papers
Publication Type :: Conference
Accession number :: 92063404
Full Text :: https://doi.org/10.1109/ICCAD.1989.76992