Analysis of Product Hot Electron Problems by Gated Emission Microscopy.

MLA

Khurana, N., and C. L. Chiang. “Analysis of Product Hot Electron Problems by Gated Emission Microscopy.” 24th International Reliability Physics Symposium, Jan. 1986, pp. 189–94. EBSCOhost, https://doi.org/10.1109/IRPS.1986.362132.

APA

Khurana, N., & Chiang, C.-L. (1986). Analysis of Product Hot Electron Problems by Gated Emission Microscopy. 24th International Reliability Physics Symposium, 189–194. https://doi.org/10.1109/IRPS.1986.362132

Chicago

Khurana, N., and C-L Chiang. 1986. “Analysis of Product Hot Electron Problems by Gated Emission Microscopy.” 24th International Reliability Physics Symposium, January, 189–94. doi:10.1109/IRPS.1986.362132.