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Effects of line size on thermal stress in aluminum conductors.

Authors :
Hosoda, T.
Niwa, H.
Yagi, H.
Tsuchikawa, H.
Source :
29th Annual Proceedings Reliability Physics 1991; 1991, p77-83, 7p
Publication Year :
1991

Details

Language :
English
ISBNs :
9780879426804
Database :
Complementary Index
Journal :
29th Annual Proceedings Reliability Physics 1991
Publication Type :
Conference
Accession number :
92145580
Full Text :
https://doi.org/10.1109/RELPHY.1991.145991