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The characteristics of silicon field emission triode.
- Source :
- 9th International Vacuum Microelectronics Conference; 1996, p538-541, 4p
- Publication Year :
- 1996
Details
- Language :
- English
- ISBNs :
- 9780780335943
- Database :
- Complementary Index
- Journal :
- 9th International Vacuum Microelectronics Conference
- Publication Type :
- Conference
- Accession number :
- 92154733
- Full Text :
- https://doi.org/10.1109/IVMC.1996.601882