Cite

Implementation of In-Line TDDB Testing for Gate Oxide Reliability Improvement.

MLA

Aldridge, B., et al. “Implementation of In-Line TDDB Testing for Gate Oxide Reliability Improvement.” International Integrated Reliability Workshop Final Report, Jan. 1993, pp. 68–78. EBSCOhost, https://doi.org/10.1109/IRWS.1993.666294.



APA

Aldridge, B., Zeglinski, D., & Vadipour, M. (1993). Implementation of In-Line TDDB Testing for Gate Oxide Reliability Improvement. International Integrated Reliability Workshop Final Report, 68–78. https://doi.org/10.1109/IRWS.1993.666294



Chicago

Aldridge, B., D. Zeglinski, and M. Vadipour. 1993. “Implementation of In-Line TDDB Testing for Gate Oxide Reliability Improvement.” International Integrated Reliability Workshop Final Report, January, 68–78. doi:10.1109/IRWS.1993.666294.