A new technique for measuring threshold voltage distribution in flash EEPROM devices.

Details

Language :

English

ISBNs :

9780780320659

Database :

Complementary Index

Journal :

Proceedings International Conference on Microelectronic Test Structures

Publication Type :

Conference

Accession number :

92250209

Full Text :

https://doi.org/10.1109/ICMTS.1995.513988