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ESSENTIAL: an efficient self-learning test pattern generation algorithm for sequential circuits.
- Source :
- Proceedings 'Meeting the Tests of Time', International Test Conference; 1989, p28-37, 10p
- Publication Year :
- 1989
Details
- Language :
- English
- Database :
- Complementary Index
- Journal :
- Proceedings 'Meeting the Tests of Time', International Test Conference
- Publication Type :
- Conference
- Accession number :
- 92252914
- Full Text :
- https://doi.org/10.1109/TEST.1989.82274