Turn-off failure mechanisms in large (2.2 kV, 20 A) MCT devices.

Authors :: Lendenmann, H.
Fichtner, W.
Source :: Proceedings of the 6th International Symposium on Power Semiconductor Devices & Ics; 1994, p207-212, 6p
Publication Year :: 1994

Language :: English
ISBNs :: 9780780314948
Database :: Complementary Index
Journal :: Proceedings of the 6th International Symposium on Power Semiconductor Devices & Ics
Publication Type :: Conference
Accession number :: 92312157
Full Text :: https://doi.org/10.1109/ISPSD.1994.583724