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Method for precise determination of the statistical distribution of the input offset voltage of differential stages.

Authors :
Thewes, R.
Schindhelm, T.
Tiebout, M.
Wohlrab, F.
Kollmer, U.
Kessel, S.
Schmitt-Landsiedel, D.
Weber, W.
Source :
Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics & Analysis; 1996, p1823-1826, 4p
Publication Year :
1996

Details

Language :
English
ISBNs :
9780780333697
Database :
Complementary Index
Journal :
Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics & Analysis
Publication Type :
Conference
Accession number :
92312355
Full Text :
https://doi.org/10.1109/ESREF.1996.888224