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Method for precise determination of the statistical distribution of the input offset voltage of differential stages.
- Source :
- Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics & Analysis; 1996, p1823-1826, 4p
- Publication Year :
- 1996
Details
- Language :
- English
- ISBNs :
- 9780780333697
- Database :
- Complementary Index
- Journal :
- Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics & Analysis
- Publication Type :
- Conference
- Accession number :
- 92312355
- Full Text :
- https://doi.org/10.1109/ESREF.1996.888224