Optimizing and controlling the radiation hardness of a CCD process.

Authors :: Wulf, F.
Heyns, M.
Debenest, P.
Debusschere, I.
Kelleher, A.
Source :: RADECS 91 First European Conference on Radiation & its Effects on Devices & Systems; 1991, p362-367, 6p
Publication Year :: 1991

Language :: English
ISBNs :: 9780780302082
Database :: Complementary Index
Journal :: RADECS 91 First European Conference on Radiation & its Effects on Devices & Systems
Publication Type :: Conference
Accession number :: 92347062
Full Text :: https://doi.org/10.1109/RADECS.1991.213574