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Dependence of the Propagation Delay of an ECL Gate on the Transistor and Circuit Parameters.

Authors :
Ghannam, M. Y.
Mertens, R. P.
Van Overstraeten, R.
Source :
ESSDERC '89: 19th European Solid State Device Research Conference; 1989, p801-806, 6p
Publication Year :
1989

Details

Language :
English
ISBNs :
9780387510002
Database :
Complementary Index
Journal :
ESSDERC '89: 19th European Solid State Device Research Conference
Publication Type :
Conference
Accession number :
92388642

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