Back to Search
Start Over
Design-for-test techniques utilized in an avionics computer MCM.
- Source :
- Proceedings of IEEE International Test Conference - (ITC); 1993, p373-382, 10p
- Publication Year :
- 1993
Details
- Language :
- English
- ISBNs :
- 9780780314306
- Database :
- Complementary Index
- Journal :
- Proceedings of IEEE International Test Conference - (ITC)
- Publication Type :
- Conference
- Accession number :
- 92440500
- Full Text :
- https://doi.org/10.1109/TEST.1993.470675