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Reduction of the number of tests by coupling together the sequential and the Bayesian method.
- Source :
- IEEE SMC'99 Conference Proceedings 1999 IEEE International Conference on Systems, Man & Cybernetics (Cat No99CH37028); 1999, Issue 1, p954-954, 1p
- Publication Year :
- 1999
Details
- Language :
- English
- ISBNs :
- 9780780357310
- Issue :
- 1
- Database :
- Complementary Index
- Journal :
- IEEE SMC'99 Conference Proceedings 1999 IEEE International Conference on Systems, Man & Cybernetics (Cat No99CH37028)
- Publication Type :
- Conference
- Accession number :
- 92482013
- Full Text :
- https://doi.org/10.1109/ICSMC.1999.814221