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Resource allocation for yield learning in semiconductor manufacturing.

Authors :
Wang, E.
Akella, R.
Source :
Proceedings of SEMI Advanced Semiconductor Manufacturing Conference & Workshop; 1995, p260-266, 7p
Publication Year :
1995

Details

Language :
English
ISBNs :
9780780327139
Database :
Complementary Index
Journal :
Proceedings of SEMI Advanced Semiconductor Manufacturing Conference & Workshop
Publication Type :
Conference
Accession number :
92496779
Full Text :
https://doi.org/10.1109/ASMC.1995.484382