A 23-ns 256 K EPROM with double-layer metal and address transition detection.

MLA

Hoff, D., et al. “A 23-Ns 256 K EPROM with Double-Layer Metal and Address Transition Detection.” IEEE Journal of Solid-State Circuits, vol. 24, no. 5, Jan. 1989, pp. 1250–58. EBSCOhost, https://doi.org/10.1109/JSSC.1989.572589.

APA

Hoff, D., Pathak, S., Payne, J., Shrivastava, R., Arreola, J. I., Norris, C., Shou-chang Tsao, Prickett, B. L., & Orput, M. (1989). A 23-ns 256 K EPROM with double-layer metal and address transition detection. IEEE Journal of Solid-State Circuits, 24(5), 1250–1258. https://doi.org/10.1109/JSSC.1989.572589

Chicago

Hoff, D., S. Pathak, J. Payne, R. Shrivastava, J.I. Arreola, C. Norris, Shou-chang Tsao, B.L. Prickett, and M. Orput. 1989. “A 23-Ns 256 K EPROM with Double-Layer Metal and Address Transition Detection.” IEEE Journal of Solid-State Circuits 24 (5): 1250–58. doi:10.1109/JSSC.1989.572589.