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ESD-resilient active biasing scheme for high-speed SSTL I/Os.

Authors :
Keel, Min-Sun
Jack, Nathan
Rosenbaum, Elyse
Source :
2013 35th Electrical Overstress/Electrostatic Discharge Symposium; 2013, p1-8, 8p
Publication Year :
2013

Details

Language :
English
ISBNs :
9781585372324
Database :
Complementary Index
Journal :
2013 35th Electrical Overstress/Electrostatic Discharge Symposium
Publication Type :
Conference
Accession number :
92910906

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