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Influences of indium fluctuation to the carrier transport, auger recombination, and efficiency droop.

Authors :
Wu, Yuh-Renn
Yeh, Shu-ting
Lin, Da-Wei
Li, Chi-kang
Kuo, Hao-Chung
Speck, James S.
Source :
2013 13th International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD); 2013, p111-112, 2p
Publication Year :
2013

Details

Language :
English
ISBNs :
9781467363099
Database :
Complementary Index
Journal :
2013 13th International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)
Publication Type :
Conference
Accession number :
92917730
Full Text :
https://doi.org/10.1109/NUSOD.2013.6633149