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A unified treatment of semiconductor boundary value problems.

Authors :
Scharfetter, D.L.
Lade, R.W.
Jordan, A.G.
Source :
IEEE Transactions on Electron Devices; 1963, Vol. 10 Issue 1, p35-43, 9p
Publication Year :
1963

Details

Language :
English
ISSN :
00189383
Volume :
10
Issue :
1
Database :
Complementary Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
93108249
Full Text :
https://doi.org/10.1109/T-ED.1963.15077