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Measurements of failure phenomena in inductively loaded multi-cathode GTO thyristors.
- Source :
- IEEE Transactions on Electron Devices; 1994, Vol. 41 Issue 2, p251-257, 7p
- Publication Year :
- 1994
Details
- Language :
- English
- ISSN :
- 00189383
- Volume :
- 41
- Issue :
- 2
- Database :
- Complementary Index
- Journal :
- IEEE Transactions on Electron Devices
- Publication Type :
- Academic Journal
- Accession number :
- 93119289
- Full Text :
- https://doi.org/10.1109/16.277370