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Design for Robustness.

Authors :
Krishnaswamy, Smita
Markov, Igor L.
Hayes, John P.
Source :
Design, Analysis & Test of Logic Circuits Under Uncertainty; 2013, p93-113, 21p
Publication Year :
2013

Details

Language :
English
ISBNs :
9789048196432
Database :
Complementary Index
Journal :
Design, Analysis & Test of Logic Circuits Under Uncertainty
Publication Type :
Book
Accession number :
93720805
Full Text :
https://doi.org/10.1007/978-90-481-9644-9_6