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A 0.8 THz fMAX SiGe HBT Operating at 4.3 K.

Authors :
Chakraborty, Partha S.
Cardoso, Adilson S.
Wier, Brian R.
Omprakash, Anup P.
Cressler, John D.
Kaynak, Mehmet
Tillack, Bernd
Source :
IEEE Electron Device Letters; Feb2014, Vol. 35 Issue 2, p151-153, 3p
Publication Year :
2014

Abstract

We demonstrate record ac performance (0.8 THz) for a silicon-germanium heterojunction bipolar transistor (SiGe HBT) operating at cryogenic temperatures. An extracted peak fMAX of 798 GHz (peak fT of 479 GHz) at 4.3 K was measured for a device with a BVCEO of 1.67 V. This scaled SiGe HBT also exhibits excellent thermal properties, as required from an electro-thermal reliability perspective. Taken together, these results strongly suggest that at the limits of scaling, robust, and manufacturable SiGe HBTs designed for room temperature operation are likely to achieve THz speeds. [ABSTRACT FROM PUBLISHER]

Details

Language :
English
ISSN :
07413106
Volume :
35
Issue :
2
Database :
Complementary Index
Journal :
IEEE Electron Device Letters
Publication Type :
Academic Journal
Accession number :
94082319
Full Text :
https://doi.org/10.1109/LED.2013.2295214