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Increasing profitability and improving semiconductor manufacturing throughput using expert systems.
- Source :
- IEEE Transactions on Engineering Management; May94, Vol. 41 Issue 2, p143, 9p, 6 Black and White Photographs, 3 Diagrams, 1 Chart, 3 Graphs
- Publication Year :
- 1994
-
Abstract
- Describes a procedure for using machine-learning classification technique coupled with an expert system to increase profitability and improve throughput in a semiconductor manufacturing environment. Identification of relationships between work-in process data and potential integrated circuit yield; Expert systems using encoded engineering expertise.
Details
- Language :
- English
- ISSN :
- 00189391
- Volume :
- 41
- Issue :
- 2
- Database :
- Complementary Index
- Journal :
- IEEE Transactions on Engineering Management
- Publication Type :
- Academic Journal
- Accession number :
- 9411304075
- Full Text :
- https://doi.org/10.1109/17.293381