Back to Search Start Over

FrontMatter.

Authors :
Franco, Jacopo
Kaczer, Ben
Groeseneken, Guido
Source :
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications; 2014, pi-xix, 19p
Publication Year :
2014

Details

Language :
English
ISBNs :
9789400776623
Database :
Complementary Index
Journal :
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Publication Type :
Book
Accession number :
94217406

Tools

Authors Abstract Subjects Details