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Pressure-induced phase transitions in single-crystalline Cu4Bi4S9 nanoribbons.
- Source :
- Chinese Physics B; Nov2013, Vol. 22 Issue 11, p116201-116205, 5p
- Publication Year :
- 2013
-
Abstract
- In situ angle dispersive synchrotron X-ray diffraction and Raman scattering measurements under pressure are employed to study the structural evolution of Cu<subscript>4</subscript>Bi<subscript>4</subscript>S<subscript>9</subscript> nanoribbons, which are fabricated by using a facile solvothermal method. Both experiments show that a structural phase transition occurs near 14.5 GPa, and there is a pressure-induced reversible amorphization at about 25.6 GPa. The electrical transport property of a single Cu<subscript>4</subscript>Bi<subscript>4</subscript>S<subscript>9</subscript> nanoribbon under different pressures is also investigated. [ABSTRACT FROM AUTHOR]
- Subjects :
- COPPER compounds
NANORIBBONS
SYNCHROTRONS
X-ray diffraction
RAMAN scattering
Subjects
Details
- Language :
- English
- ISSN :
- 16741056
- Volume :
- 22
- Issue :
- 11
- Database :
- Complementary Index
- Journal :
- Chinese Physics B
- Publication Type :
- Academic Journal
- Accession number :
- 94288159
- Full Text :
- https://doi.org/10.1088/1674-1056/22/11/116201