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Sub-Wavelength Near-Field Metal Detection using an On-Chip Spintronic Technique.
- Source :
- Chinese Physics Letters; Dec2013, Vol. 30 Issue 12, p128501-128503, 3p
- Publication Year :
- 2013
-
Abstract
- A spintronic near-field microwave imaging system without vector network analyzers is used to detect the distribution of microwaves, which are scattered by a sub-wavelength periodical metal wire grating. An ultra thin metal body with diameter of 100 μm (λ/300) is observed by imaging illuminated by a 10 GHz shining source. An application with high sensitivity and resolution detection is proposed in the microwave region under a weak applied external static magnetic field. [ABSTRACT FROM AUTHOR]
- Subjects :
- SPINTRONICS
MICROELECTRONICS
NEAR-fields
MICROWAVE imaging
IMAGING systems
Subjects
Details
- Language :
- English
- ISSN :
- 0256307X
- Volume :
- 30
- Issue :
- 12
- Database :
- Complementary Index
- Journal :
- Chinese Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 94296669
- Full Text :
- https://doi.org/10.1088/0256-307X/30/12/128501