Sub-Wavelength Near-Field Metal Detection using an On-Chip Spintronic Technique.

A spintronic near-field microwave imaging system without vector network analyzers is used to detect the distribution of microwaves, which are scattered by a sub-wavelength periodical metal wire grating. An ultra thin metal body with diameter of 100 μm (λ/300) is observed by imaging illuminated by a 10 GHz shining source. An application with high sensitivity and resolution detection is proposed in the microwave region under a weak applied external static magnetic field. [ABSTRACT FROM AUTHOR]