Real-time measurement of optical anisotropy during film growth using a chemical mist deposition of poly(3,4-ethylenedioxythiophene): poly(styrenesulfonate).

Real-time monitoring of optical anisotropy during growth by the chemical mist deposition of poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate) (PEDOT:PSS) films was carried out using spectroscopic ellipsometry. The microstructure of the grown films was found to be primarily determined by the DC bias applied to the mesh electrode. The ellipsometry results revealed that uniaxial anisotropy appeared for film thicknesses of about 5 nm and above, which corresponds to the average size of PEDOT crystallites. The extraordinary refractive index was found to be strongly correlated with the carrier mobility. Both the degree of optical anisotropy and the carrier mobility could be controlled during film growth by adjusting the DC bias. [ABSTRACT FROM AUTHOR]