Photoluminescence Studies on Off-Stoichiometric Defects in Sprayed CZTS Thin Films.

Authors :: Poornima, N.
Rajeshmon, V. G.
Kartha, C. Sudha
Vijayakumar, K. P.
Source :: AIP Conference Proceedings; 2014, Vol. 1591, p614-616, 3p, 4 Graphs
Publication Year :: 2014
Abstract: Photoluminescence (PL) technique was used for studying the defects in Copper Zinc Tin Sulphide (CZTS) thin films deposited by Chemical Spray Pyrolysis (CSP). Measurements were done on films prepared for different Cu:Zn:Sn:S ratios. An emission at 0.805 eV was monitored from 15 K to room temperature and activation energy was calculated. Excitation power dependent studies were done to analyze the type of transition. [ABSTRACT FROM AUTHOR]

Subjects :: PHOTOLUMINESCENCE
STOICHIOMETRY
THIN films
TEMPERATURE effect
KESTERITE
PYROLYSIS

Full Text Access

Tools