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XPS Depth Profile Study of Sprayed CZTS Thin Films.
- Source :
- AIP Conference Proceedings; 2014, Vol. 1591, p1666-1668, 3p, 3 Graphs
- Publication Year :
- 2014
-
Abstract
- XPS depth profile studies were carried out to analyze the composition and stoichiometry of sprayed CZTS thin films giving an efficiency of 1.85% in CZTS based thin film solar cell. Surface layers were nearly stoichiometric (Cu:Zn:Sn:S=2:1:1:4) whereas the inner layers were found to be Copper rich in composition making it electrically more conductive. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 0094243X
- Volume :
- 1591
- Database :
- Complementary Index
- Journal :
- AIP Conference Proceedings
- Publication Type :
- Conference
- Accession number :
- 95776507
- Full Text :
- https://doi.org/10.1063/1.4873070