XPS Depth Profile Study of Sprayed CZTS Thin Films.

Authors :: Deepu, D. R.
Rajeshmon, V. G.
Kartha, C.Sudha
Vijayakumar, K. P.
Source :: AIP Conference Proceedings; 2014, Vol. 1591, p1666-1668, 3p, 3 Graphs
Publication Year :: 2014
Abstract: XPS depth profile studies were carried out to analyze the composition and stoichiometry of sprayed CZTS thin films giving an efficiency of 1.85% in CZTS based thin film solar cell. Surface layers were nearly stoichiometric (Cu:Zn:Sn:S=2:1:1:4) whereas the inner layers were found to be Copper rich in composition making it electrically more conductive. [ABSTRACT FROM AUTHOR]