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Structural and magnetotransport properties of ultrathin Co/ZnO and Co/ZnAlO films.

Authors :
Zhi-Yong Quan
Xian-Peng Zhang
Wei Liu
Albargi, H. B.
Gehring, G. A.
Xiao-Hong Xu
Source :
Journal of Applied Physics; 2014, Vol. 115 Issue 23, p233908-1-233908-5, 5p, 4 Graphs
Publication Year :
2014

Abstract

We report the structural and magnetotransport properties of ultrathin superparamagnetic Co/ZnO and Co/ZnAlO films deposited by sequentially sputtering Co layers and semiconductor layers. The films consisting of Co nanodots embedded in an amorphous semiconductor matrix exhibit large room temperature tunneling magnetoresistance with a maximum value of over 7%. The singlelayer- nanodot structures gradually develop in the films with thicknesses below 8 nm, where tunneling processes existing only between nanodots that lie in a plane are realized. The tunneling magnetoresistance ratio at room temperature is as high as 5% although the thickness of the Co/ZnAlO film is as thin as 3.2 nm. These single-layer-nanodot films having high tunneling magnetoresistance ratios and superparamagnetic behavior can be used in transparent nano-granular in gap sensors. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
115
Issue :
23
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
96727097
Full Text :
https://doi.org/10.1063/1.4883535