Relevance of non-exponential single-defect-induced threshold voltage shifts for NBTI variability.

Details

Language :

English

ISBNs :

9781479903528

Database :

Complementary Index

Journal :

2013 IEEE International Integrated Reliability Workshop Final Report

Publication Type :

Conference

Accession number :

97031373

Full Text :

https://doi.org/10.1109/IIRW.2013.6804161