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Electron delay analysis and image charge effect in AlGaN/GaN HEMT on silicon substrate.

Authors :
Agboton, A.
DeFrance, N.
Altuntas, P.
Avramovic, V.
Cutivet, A.
Ouhachi, R.
De Jaeger, J. C.
Bouzid-Driad, S.
Maher, H.
Renvoise, M.
Frijlink, P.
Source :
2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC); 2013, p57-60, 4p
Publication Year :
2013

Details

Language :
English
ISBNs :
9781479906499
Database :
Complementary Index
Journal :
2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC)
Publication Type :
Conference
Accession number :
97032553
Full Text :
https://doi.org/10.1109/ESSDERC.2013.6818818
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