RFID Test Platform: Nonlinear Characterization.

This paper presents a complete radio frequency identification (RFID) test platform to characterize the nonlinear effects produced by passive ultra-high frequency (UHF) RFID chips. In full operation mode, automated measurements of activation power, harmonic response level, and impedances are performed in a wide frequency range up to the fourth harmonic. The characterization method, platform composition, and operation are explained through real measurements on UHF Class-1 Generation-2 chips. A harmonic treatment is presented thanks to the joint use of an RFID tester and impedance tuners, and the effect of the antenna-chip impedance matching on the harmonic responses is compared before and after treatment. To the best of our knowledge, no similar platform has been presented in the literature. [ABSTRACT FROM PUBLISHER]